Series 3 devices answers challenges that continued acceleration of IoT poses--demands for more processing power at far-edge devices across IoT applications & demands for increasingly portable, secure, compute-intensive applications.
Keysight's 4881HV High Voltage Wafer Test System improves the productivity of power semiconductor manufacturers by enabling parametric tests up to 3kV supporting high and low-voltage in one-pass test.
The new launch transforms home and enterprise networks with integration of Wi-Fi 7 and edge AI, injecting intelligence into connected devices, & significantly optimizing Wi-Fi connectivity & networking performance.
Innodisk, a leading global AI solution provider, has introduced an innovative AI-based InnoPPE recognition solution to improve safety and compliance in high-risk industrial environments.
CETEX, the all-new Consumer Electronics Test & Development Forum and Expo, invites test and development engineers to RAI in Amsterdam from October 9 to 10, 2024. There, Rohde & Schwarz will exhibit its advanced test and measurement solutions that address the latest emerging challenges in consumer electronics development. Visitors can connect with the company’s experts and explore the latest technologies that help them enhance EMC compliance, debug digital protocols faster, or improve the energy efficiency of their products.
Advanced multi-speed OLT-ONU platform enables operators to run mission-critical AI applications at the edge while providing the most cost-effective and power-efficient upgrade path for current GPON and 10G PON networks.
Ansys' certified semiconductor solutions will enable Faraday to shorten design cycles of 2.5D/3D-ICs and ensure designs meet signal integrity and performance goals.
The collaboration will allow OEMs to explore new business opportunities for NTN 5G communication, extending coverage to previously inaccessible areas and enabling innovative applications previously considered too expensive.